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학술저널
저자정보
저널정보
한국태양에너지학회 한국태양에너지학회 논문집 한국태양에너지학회 논문집 제23권 제2호
발행연도
2003.6
수록면
59 - 70 (12page)

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A stoichiometric mixture of evaporating materials for CuGaSe₂ single crystal thin films was prepared from horizontal electric furnace. Using extrapolation method of X-ray diffraction patterns for the polycryst al CuGaSe₂, it was found tetragonal structure whose lattice constant a_0 and c_0 were 5.615 A and 11.025 A, respectively. To obtain the single cryst al thin films , CuGaSe₂ mixed cryst al was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperatures were 610℃ and 450℃ , respectively. The cryst alline structure of thesingle cryst al thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD) . The carrier density and mobility of CuGaSe₂ single crystal thin films measured with Hall effect by van der Pauw method are 5.01×10^17 cm-³ and 245 cm²/V·sat 293 K, respectively. The temperature dependence of the energy band gap of the CuGaSe₂ obtained from the absorption spectra was well described by the Varshni's relation, E_g(T) = 1.7998 eV-(8.7489×10-⁴eV/K)T²/(T+335K). After the as-grown CuGaSe₂ single cryst al thin films was annealed in Cu-, Se-, and Ga- atmospheres, the origin of point defects of CuGaSe₂ single crystal thin films has been investigated by the photoluminescence(PL) at 10K. The native defects of V_cu , V_se , Cu_int, and Se_int obtained by PL measurements were classified as a donors or acceptors type. And we concluded that the heat-treatment in the Cu-atmosphere converted CuGaSe₂ single crystal thin films to an optical n-type. Also, we confirmed that Ga in CuGaSe₂/GaAs did not form the native defects because Ga in CuGaSe₂ single crystal thin films existed in the form of stable bonds.

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2. 실험 및 측정

3. 실험 결과 및 고찰

4. 결론

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UCI(KEPA) : I410-ECN-0101-2009-563-018132791