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The stochiometric mix of evaporating materials for the CuInSe₂ single crystal thin films was prepared from horizontal furnace. To obtain the single crystal thin films, CuInSe₂ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were 620 ℃ and 410 ℃, respectively. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of CuInSe₂ single crystal thin films measured from Hall effect by van der Pauw method are 9.62×10^(16) ㎝-³, 296 ㎠/Vㆍs at 293 K, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the CuInSe₂ single crystal thin film, we have found that the values of spin orbit splitting △So and the crystal field splitting △Cr were 6.1 meV and 175.2 meV at 10 K, respectively. From the photoluminescence measurement on CuInSe₂ single crystal thin film, we observed free excition (Ex) existing only high quality crystal and neutral bound exiciton (D°,X) having very strong peak intensity. Then, the full-width-at -half-maximum(FWHM) and binding energy of neutral donor bound excition were 7 meV and 5.9 meV, respectivity. By Haynes rule, an activation energy of impurity was 59 meV.

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2. 실험 및 측정

3. 실험 결과 및 고찰

4. 결론

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UCI(KEPA) : I410-ECN-0101-2009-563-018155127