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논문 기본 정보

자료유형
학술저널
저자정보
Eunsang Lee (Hanyang University) Sanghun Lee (Hanyang University) Changhyun Pyo (Hanyang University) Hyunseok Kim (Hanyang University) Jaeduk Han (Hanyang University)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.24 No.4
발행연도
2024.8
수록면
355 - 364 (10page)
DOI
10.5573/JSTS.2024.24.4.355

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초록· 키워드

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This paper presents a 2-GS/s 6-bit single-channel speculative loop-unrolled successive approximation register (SAR) analog-to-digital converter (ADC) with comparator offset calibration. The proposed loop-unrolled SAR ADC speeds up its conversion speed by selecting one of the pre-determined capacitive digital-to-analog converters (CDACs) speculatively. A foreground comparator offset calibration for the speculative loop-unrolled SAR ADC is introduced to improve the ADC performance by reducing the input parasitic capacitance and minimizing the logic fan-out in comparator internal clock path. The CDAC switching method that minimizes the variation of the output common-mode (CM) voltage is applied to be compatible with the proposed foreground comparator offset calibration. In addition, the modified double-tail comparator structure is adopted for reducing the kickback noise without the speed overhead. The proposed SAR ADC achieves a 2-GS/s sampling rate with only a single-channel without a time-interleaving technique. The ADC is fabricated in 28-nm CMOS and has a 33.1-dB SNDR at a low input frequency and a 29.9-dB SNDR at the Nyquist frequency with a 6.2- mW power consumption from 1.2-V supply voltage.

목차

Abstract
I. INTRODUCTION
II. SPECULATIVE LOOP-UNROLLED SAR ADC
III. COMPARATOR OFFSET CALIBRATION FOR SPECULATIVE LOOP-UNROLLED SAR ADC
IV. DESIGN IMPLEMENTATIONS
V. MEASUREMENT RESULTS
IV. CONCLUSION
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