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논문 기본 정보

자료유형
학술저널
저자정보
Ko Kwang Kyu (Department of Materials Engineering and Convergence Technology Gyeongsang National University (GNU)) Jang Jin Ho (Department of Metallurgical and Materials Engineering Gyeongsang National University (GNU)) Tiwari Saurabh (Department of Materials Engineering and Convergence Technology Gyeongsang National University (GNU)) Hyo Ju Bae (Department of Materials Engineering and Convergence Technology Gyeongsang National University (GNU)) Sung Hyo Kyung (Department of Materials Engineering and Convergence Technology Gyeongsang National University (GNU)) Kim Jung Gi (Department of Materials Engineering and Convergence Technology Gyeongsang National University (GNU)) 설재복 (경상국립대학교)
저널정보
한국현미경학회 한국현미경학회지 한국현미경학회지 제52권 제1호
발행연도
2022.3
수록면
1 - 10 (10page)
DOI
10.1186/s42649-022-00074-1

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The use of Pipelines for long-distance transportation of crude oil, natural gas and similar applications is increasing and has pivotal importance in recent times. High specific strength plays a crucial role in improving transport efficiency through increased pressure and improved laying efficiency through reduced diameter and weight of line pipes. TRIP-based high-strength and high-ductility alloys comprise a mixture of ferrite, bainite, and retained austenite that provide excellent mechanical properties such as dimensional stability, fatigue strength, and impact toughness. This study performs microstructure analysis using both Nital etching and LePera etching methods. At the time of Nital etching, it is difficult to distinctly observe second phase. However, using LePera etching conditions it is possible to distinctly measure the M/A phase and ferrite matrix. The fraction measurement was done using OM and SEM images which give similar results for the average volume fraction of the phases. Although it is possible to distinguish the M/A phase from the SEM image of the sample subjected to LePera etching. However, using Nital etching is nearly impossible. Nital etching is good at specific phase analysis than LePera etching when using SEM images.

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