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논문 기본 정보

자료유형
학술저널
저자정보
Kyunghwan Min (Kwangwoon University) Sanggeun Lee (Kwangwoon University) Taehyoun Oh (Kwangwoon University)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.21 No.3
발행연도
2021.6
수록면
199 - 205 (7page)
DOI
10.5573/JSTS.2021.21.3.199

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초록· 키워드

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A phase interpolator (PI) based all-digital clock and data recovery (CDR) system has been fabricated in 65 nm CMOS process. The segmented switching units control the slew rate of input clock signal in the PI and the linearity of PI control code and output phase shift steps is improved by 0.4 LSB for standard deviation of differential nonlinearity (DNL). The measurement results show that our CDR locks successfully for 6 Gbit/s non-return to zero (NRZ) high-speed signal with 2<SUP>31-1</SUP> pseudo-random bit sequence (PRBS) pattern. The input NRZ input signal has 2.05 ps of root-mean square (RMS) jitter and 1 V<SUB>dpp</SUB> of swing. When the loop is locked, the output clock signal shows 12.2 ps of peak-to-peak jitter and 1.826 ps of RMS jitter, which is divide 16 speed of the full rate. The measured phase noise of the recovered clock is -114.72 dBc/Hz at 1 MHz offset. The designed built-in pattern checker in receiver exhibits 10<SUP>-12</SUP> of bit error rate (BER) at the center of data eye. The lock time of the loop measured via 7-bit monitoring digital-to-analog converter (DAC) is 54.5 ns. The prototype CDR occupies 0.073 mm² chip area and consumes 17.4 mW from 1.0 V power supply.

목차

Abstract
I. INTRODUCTION
II. ARCHITECTURE
III. CIRCUIT DESCRIPTION
IV. MEASUREMENT RESULTS
V. CONCLUSION
REFERENCES

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