반도체 FAB근무에 대한 정량적 노출지표 개발

신규식; 김태훈; 정현희; 조수헌; 이경호

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자료유형: 학술저널

저자정보: 신규식 (삼성전자 건강연구소) 김태훈 (삼성전자 건강연구소) 정현희 (삼성전자 건강연구소) 조수헌 (삼성전자 건강연구소) 이경호 (삼성전자 건강연구소)

저널정보: 한국산업보건학회 (구 한국산업위생학회) 한국산업보건학회지 한국산업보건학회지 제27권 제3호

발행연도: 2017.1

수록면: 187 - 192 (6page)

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Objectives: It is difficult to identify exposure factors in the semiconductor industry due to low exposure levels to hazardous substances and because various processes take place in fabrication (FAB). Furthermore, a single worker often experiences a variety of job histories, so it is difficult to classify similar exposure groups (SEG) in the semiconductor industry. Therefore, we intend to develop a new exposure index, the period of working in FAB, that is applicable to the semiconductor industry. Methods: First, in specifying the classification of jobs, we clearly distinguished whether they were FAB workers or non-FAB workers. We checked FAB working hours per week through questionnaires administered to FAB workers. We derived an exposure index called FAB-Year that can represent the period of working in FAB. FAB-Year is an index that can quantitatively indicate the period of working in FAB, and one FAB-Year is defined as working in FAB for 40 hours per week for one year. Results: A total of 8,453 persons were surveyed, and male engineers and female operators occupied 90% of the total. The average total years of service of the subjects was 9.7 years, and the average FAB-Year value was 6.8. This means that the FAB-working ratio occupies 70% of total years of service. The average FAB-Year value for female operators was 8.4, for male facility engineers it was 7.7, and for male process engineers it was 3.5. A FAB-Year standardization value according to personal information (gender, job group, entry year, retirement year) for the survey subjects can be calculated, and standardized estimation values can be applied to workers who are not participating in the survey, such as retirees and workers on a leave of absence (LOA). Conclusions: This study suggests an alternative method for overcoming the limitations on epidemiological study of the semiconductor industry where it is difficult to classify exposure groups by developing a new exposure index called FAB-Year. Since FAB-Year is a quantitative index, we expect that various approaches will be possible in future epidemiological studies.

#FAB-Year #Exposure index #Semiconductor #Similar exposure group

참고문헌 (12)

참고문헌 신청

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