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Subject

Analysis of Structural Characteristics of Charge Trap Flash Memory with Tunneling Field Effect Transistor
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터널링 소자 기반 전하 트랩 플래시 메모리 구조적 특성 분석

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Type
Proceeding
Author
Kyungchul Park (서울대학교) Sungmin Hwang (서울대학교) Jeong-Jun Lee (서울대학교) Taejin Jang (서울대학교) Kitae Lee (서울대학교) Byung-Gook Park (서울대학교)
Journal
The Institute of Electronics and Information Engineers 대한전자공학회 학술대회 2017년도 대한전자공학회 하계종합학술대회
Published
2017.6
Pages
141 - 143 (3page)

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Analysis of Structural Characteristics of Charge Trap Flash Memory with Tunneling Field Effect Transistor
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UCI(KEPA) : I410-ECN-0101-2018-569-001046392