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논문 기본 정보

자료유형
학술저널
저자정보
Prateek Kumar (University of Delhi) Maneesha Gupta (Netaji Subhas Institute of Technology) Gaurav Kr (University of Delhi) Naveen Kumar (Dr. B R Ambedkar National Institute of Technology) Vishal Yadav (University of Delhi)
저널정보
한국전기전자재료학회 Transactions on Electrical and Electronic Materials Transactions on Electrical and Electronic Materials 제22권 제4호
발행연도
2021.8
수록면
467 - 472 (6page)
DOI
https://doi.org/10.1007/s42341-020-00251-7

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초록· 키워드

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At nanoscale along with the failure of Metal oxide semiconductor field-effect transistor due to short channel effects, Silicon has raised as another bottleneck for researchers. In the last couple of decades, researchers have provided diff erent solutions in the form of Graphene and Transition Metal Dichalcogenides materials. Each Graphene and Transition Metal Dichalcogenides has its own set of disadvantages like poor I ON /I OFF ratio and lower carrier mobility and hence cannot be used individually. In this article, a tub type metal oxide semiconductor field-effect transistor is designed and for application of the device in a low power VLSI domain, the back-gated technique is used. Different device properties are studied first with a Silicon-based channel and then a Silicon-Tungsten Disulphide heterojunction channel. The selection of SiO2 as a gate insulator and contact material is also justified. This article shows that instead of using conventional Silicon-based devices it is better to use heterojunction devices, as they offer much lower OFF-state current and better linearity properties.

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