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논문 기본 정보

자료유형
학술저널
저자정보
Songnan Guo (University of Electronic Science and Technology of China) Junji Cheng (University of Electronic Science and Technology of China) Xing Bi Chen (University of Electronic Science and Technology of China)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.19 No.5
발행연도
2019.10
수록면
454 - 460 (7page)
DOI
10.5573/JSTS.2019.19.5.454

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초록· 키워드

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A silicon-on-insulator (SOI) lateral doublediffused MOSFET (LDMOS) with variable-k dielectric is proposed, which features three-section high-k dielectrics placed over the drift region. Beneficial from the modulation, by high-k dielectrics, on electric fluxes in the drift region, the electric field strength is locally enhanced, and has a more uniform distribution along the surface of the drift region, which an increment of the breakdown voltage (BV) ascribes to. Moreover, due to the electric fluxes prefer to flow towards and through a high-k dielectric, an increase in the dose of the drift region is thus possible to reduce the specific on-resistance (R<SUB>on,sp</SUB>), since the extra electric fluxes caused by those increased impurities would flow, upwards, into the high-k dielectric, and barely make contributions to the xcomponent of the surface electric field, which indicates that the BV would not be affected. Based on a comparison with the conventional LDMOS, the BV of the proposed LDMOS increased by 31% with a decrease of 13% in the R<SUB>on,sp</SUB>. The figure of merit (FOM) increased approximately 2 times.

목차

Abstract
Ⅰ. INTRODUCTION
Ⅱ. DEVICE STRUCTURE AND MECHANISM
Ⅲ. RESULTS AND DISCUSSION
Ⅳ. CONCLUSIONS
REFERENCES

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