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자료유형
학술저널
저자정보
저널정보
한국센서학회 센서학회지 센서학회지 제15권 제6호
발행연도
2006.1
수록면
379 - 385 (7page)

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Single crystal of p-CdIn2Te4 was grown in a three-stage vertical electric furnace by using Bridgman method. The quality of the grown crystal has been investigated by x-ray diffraction and photoluminescence measurements. From the photoluminescence spectra of the as-grown CdIn2Te4 crystal and the various heat-treated crystals, the (Do, X) emission was found to be the dominant intensity in the photoluminescence spectrum of the CdIn2Te4:Cd, while the (Ao, X) emission completely disappeared in the CdIn2Te4:Cd. However, the (Ao, X) emission in the photoluminescence spectrum of the CdIn2Te4:Te was the dominant intensity like in the as-grown CdIn2Te4 crystal. These results indicated that the (Do, X) is associated with VTe which acted as donor and that the (Ao, X) emission is related to VCd which acted as acceptor, respectively. The p-CdIn2Te4 crystal was obviously found to be converted into n-type after annealing in Cd atmosphere. The origin of (Do, Ao) emission and its to phonon replicas is related to the interaction between donors such as VTe or Cdint, and acceptors such as VCd or Teint. Also, the In in the CdIn2Te4 was confirmed not to form the native defects because it existed in a stable bonding form.

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