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논문 기본 정보

자료유형
학술대회자료
저자정보
Wenbo Wang (Delft University of Technology) Frans Pansier (Delft University of Technology) Jelena Popovic (Delft University of Technology) J.A. Ferreira (Delft University of Technology)
저널정보
전력전자학회 ICPE(ISPE)논문집 ICPE 2015-ECCE Asia
발행연도
2015.6
수록면
1,846 - 1,853 (8page)

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In this paper, investigations on optimal topology and operation mode for low voltage GaN HEMT are performed. Analytical loss model of GaN HEMT, in which influences of circuit and package parasitics are accounted for, is developed as a tool to analyze losses in GaN HEMT in different switching conditions. Analysis results shows that when applied in both V<SUB>out</SUB>〈2V<SUB>in</SUB> and V<SUB>out</SUB>〉2V<SUB>in</SUB> situations in Boundary Conduction Mode with Valley Switching(BCM-VS) in a boost converter, where GaN HEMT is switched on when voltage across it is lowered, switching loss can be greatly reduced. Switching loss reduction results not only from the exemption of discharging the large output capacitance of GaN HEMT at high voltage, but also from the fact that parasitic inductance has much less effects on switching loss in GaN HEMT in BCM-VS than in Continuous Conduction Mode (CCM). Limitations and design tradeoffs when GaN HEMT is applied in BCM-VS are also revealed. Forward voltage of GaN HEMT in reverse conduction is high and its conduction should be prevented when V<SUB>out</SUB>〉 to achieve conduction loss reduction. This further loss reduction can be realized by switching on transistor before valley point. Besides, in BCM-VS, overvoltage on GaN HEMT is larger and oscillatory energy dissipation in circuit is higher than in CCM due to higher turn off current. Paralleling external capacitor to the transistor helps to ease voltage stress; however turn on loss will be increased. This loss increase is more severe in the case of V<SUB>out</SUB>〈2V<SUB>in</SUB> than V<SUB>out</SUB>〉2V<SUB>in</SUB>. Trade-offs on the selection of proper external capacitor value exists between increased switching loss and reduced voltage stress. Experimental setup is built to verify and demonstrate the analysis.

목차

Abstract
I. INTRODUCTION
II. MODELING AND ANALYSIS OF LOSSES IN GAN HEMT IN A BOOST CONVERTER
III. OPTIMAL UTILIZATION OF GAN HEMT IN A HIGH FREQUENCY BOOST CONVERTER
IV. EXPERIMENTAL RESULTS
V. CONCLUSIONS
REFERENCES

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