지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
이용수7
2012
1. INTRODUCTION 11.1 Background 11.2 Previous study based on the conventional method 31.2.1 Mechanical method of measuring adhesion 31.2.2 Conventional nondestructive method of measuring adhesion 61.2.3 Scanning acoustic microscopy for thin film characterization 91.2.4 Evaluation of adhesion using scanning acoustic microscopy 111.2.5 Ultrasonic atomic force microscopy 171.3 Research contents 182. EVALUATION OF ADHESIVE INTERFACE BY SCANNING ACOUSTIC MICROSCOPY 202.1 Introduction 202.2 Theoretical consideration 212.2.1 Imaging principal 212.2.2 Acoustic wave velocity measurement 242.2.3 Rayleigh wave 282.2.4 Reflectance function 322.2.5 Acoustic spectroscopy 382.2.6 Surface wave velocity measurement with V(z) curve method 412.2.7 Optimization of the measurement precision 442.3 Experimental details 452.3.1 Fabrication of the thin films by spin coating method 452.3.2 Experimental setup of scanning acoustic microscopy 492.3.3 The procedure of V(z) analysis 512.4 Experimental results 532.4.1 Optical microscopy image of the thin film surface 532.4.2 Thickness measurement by SEM 552.4.3 Measurement of surface wave velocity with V(z) method 692.5 Summary 653. VERIFICATION OF THE ADHESIVE INTERFACE BY NANO-SCRATCH TEST 663.1 Introduction 663.2 Theoretical consideration 683.2.1 Calculation of the work of adhesion by Laugier model 683.2.2 Calculation of the work of adhesion by Bull and Rickerby model 703.3 Experimental details 743.4 Experimental results 773.5 Summary 894. VISUALIZATION OF THE ADEHSIVE INTERFACE BY UAFM 904.1 Introduction 904.2 Theoretical consideration 914.3 Experimental details 964.3.1 Fabrication of the copper film system by physical vapor deposition 964.3.2 Fabrication of the polymeric films covered with SU-8 photo resist 984.3.3 Experimental setup 1004.4 Experimental results 1024.4.1 Measurement of the contact resonance frequency accordance with thin film thickness 1024.4.2 Subsurface image of the thin film covered with SU-8 photo resist 1044.4.3 Visualization of the adhesive interface 1074.5 Summary 1115. CONCLUSIONS 112REFERENCE 114Appendex A Weglein’s ray approach for V(z) curve 123Appendex B Burtoni’s approach for V(z) curve 127
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