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논문 기본 정보

자료유형
학술저널
저자정보
Si-Jun Kim (Chungnam National University) Won-Nyoung Jeong (Chungnam National University) Young-Seok Lee (Chungnam National University) You-Bin Seol (Chungnam National University) Chul-Hee Cho (Chungnam National University) In-Ho Seong (Chungnam National University) Min-Su Choi (Chungnam National University) Shin-Jae You (Chungnam National University)
저널정보
한국진공학회(ASCT) Applied Science and Convergence Technology Applied Science and Convergence Technology Vol.32 No.5
발행연도
2023.9
수록면
127 - 133 (7page)

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초록· 키워드

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Plasma diagnostics, especially electron density measurements, have attracted much attention as it promotes an understanding of plasma and its applications. In this study, a parallel double-curling probe, which consists of two individual curling slot antennae and one microwave input/output port, is demonstrated for multisite electron density measurements using three-dimensional electromagnetic wave simulations. We verify its step-by-step operation, including the demonstration of a single curling probe, double-curling probe, and parallel double-curling probe. For the single curling probe, we introduce a curling probe operation, while for the double-curling probe, we verify the operation of two curling probes with a single microwave input/output port. With respect to the parallel double-curling probe, simulation results indicate that it can measure the multi-site electron density above its individual curling-slot antenna. This study is applicable for the parallelization and multiplication of curling probes in the development of plasma uniformity sensors.

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ABSTRACT
1. Introduction
2. Single curling probe
3. Double-curling probe
4. Parallel double-curling probe
5. Conclusion
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