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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2021.12
- 수록면
- 1 - 7 (7page)
- DOI
- 10.1186/s42649-021-00068-5
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The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.
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참고문헌 (14)
참고문헌 신청
B. Basnar / 2003 / Focused ion beam induced surface amorphization and sputter processes / J. Vac. Sci. Technol. B 21:927~930
S. D. Findlay / 2016 / Direct visualization of lithium via annular bright field scanning transmission electron microscopy: A review / Microscopy 66:3~14
R. Jiang / 2019 / Application of BIB polishing technology in cross-section preparation of porous, layered and powder materials: A review / Front. Mater. Sci. 13:107~125
N. I. Kato / 2004 / Reducing focused ion beam damage to transmission electron microscopy samples / J. Electron Microsc 53:451~458
B. Key / 2009 / Realtime NMR investigations of structural changes in silicon electrodes for Lithium-ion batteries / J. Am. Chem. Soc 131:9239~9249
S. D. Findlay / 2016 / Direct visualization of lithium via annular bright field scanning transmission electron microscopy: A review / Microscopy 66:3~14
R. Jiang / 2019 / Application of BIB polishing technology in cross-section preparation of porous, layered and powder materials: A review / Front. Mater. Sci. 13:107~125
N. I. Kato / 2004 / Reducing focused ion beam damage to transmission electron microscopy samples / J. Electron Microsc 53:451~458
B. Key / 2009 / Realtime NMR investigations of structural changes in silicon electrodes for Lithium-ion batteries / J. Am. Chem. Soc 131:9239~9249
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