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논문 기본 정보

자료유형
학술저널
저자정보
Bo Pu (Samsung Electronics) Jonghyeon Kim (Hyundai MOBIS) Wansoo Nah (Sungkyunkwan University)
저널정보
한국전자파학회JEES Journal of Electromagnetic Engineering And Science Journal of Electromagnetic Engineering And Science Vol.15 No.4
발행연도
2015.10
수록면
258 - 265 (8page)

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초록· 키워드

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A de-embedding method for multiport networks, especially for coupled odd interconnection lines, is presented in this paper. This method does not require a conversion from S-parameters to T-parameters, which is widely used in the de-embedding technique of multiport networks based on cascaded simple two-port relations, whereas here, we apply an operation to the S-matrix to generate all the uncoupled and coupled coefficients. The derivation of the method is based on the relations of incident and reflected waves between the input of the entire network and the input of the intrinsic device under test (DUT). The characteristics of the intrinsic DUT are eventually achieved and expressed as a function of the S-parameters of the whole network, which are easily obtained. The derived coefficients constitute ABCD-parameters for a convenient implementation of the method into cascaded multiport networks. A validation was performed based on a spice-like circuit simulator, and this verified the proposed method for both uncoupled and coupled cases.

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Abstract
I. INTRODUCTION
II. MULTIPORT DE-EMBEDDING TECHNIQUES FOR UNCOUPLED INTERCONNECTION LINES
III. MULTIPORT DE-EMBEDDING TECHNIQUES FOR COUPLED INTERCONNECTION LINES
IV. CASE STUDY FOR COUPLED INTERCONNECTION LINES
V. CONCLUSION
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