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논문 유사도에 따라 DBpia 가 추천하는 논문입니다. 함께 보면 좋을 연관 논문을 확인해보세요!
Electrical Characteristics of Te-based Ovonic Threshold Switching Devices by Post-Deposition Annealing
한국진공학회 학술발표회초록집
2021 .02
Optimizing interface between electrode and chalcogenide based material in Ovonic Threshold Switch devices
한국진공학회 학술발표회초록집
2019 .08
Subthreshold Conduction Model for Te-based Threshold Swtiching Devices
한국진공학회 학술발표회초록집
2019 .08
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
한국현미경학회지
2021 .06
Reactive Ion Etching of Ovonic Threshold Switch (OTS) Material using Hydrogen based Plasmas for PRAM device
한국진공학회 학술발표회초록집
2020 .02
Sub-threshold current model of Ge-Te ovonic threshold switch
한국진공학회 학술발표회초록집
2020 .08
RF Sputtering of SiTe for Ovonic Threshold Switching
한국진공학회 학술발표회초록집
2018 .02
Fabrication and Characterization of Ge1-xSex Selector Devices
한국진공학회 학술발표회초록집
2020 .02
Elucidating the threshold switching behavior of chalcogenide selector devices based on a circuit model
한국진공학회 학술발표회초록집
2020 .08
SiTe Ovoinic Threshold Switches for X-point memory Neuromorphic Synaptic Device aApplications
한국진공학회 학술발표회초록집
2018 .08
Off-Current Analysis with Temperature-Dependent Subthreshold Conduction in SiTe Based Amorphous Chalcogenides for Ovonic Threshold Switching Selector Application
Applied Science and Convergence Technology
2024 .07
Electrical Properties of GexSe1-x Selector Devices with Uniform and Localized Electric Fields
한국진공학회 학술발표회초록집
2020 .08
Computer simulation for non-contact atomic force microscopy
한국진공학회 학술발표회초록집
2016 .08
Conductive Atomic Force Microscopy(C-AFM)를 이용한 GaSb 상변화 메모리 전기적 특성 분석
한국진공학회 학술발표회초록집
2015 .02
Reactive Ion Etching of PRAM material using Hydrogen based Gases
한국진공학회 학술발표회초록집
2020 .08
Influence of composition on the atomic structure of GexTe1-x films
한국진공학회 학술발표회초록집
2020 .02
Ovonic Threshold Switch based on Multilayer Ge-Te System
한국진공학회 학술발표회초록집
2020 .02
Fused sliced inverse regression in survival analysis
CSAM(Communications for Statistical Applications and Methods)
2017 .09
Imaging three-dimensional surface systems using non-contact atomic force microscopy
한국진공학회 학술발표회초록집
2016 .08
On robustness in dimension determination in fused sliced inverse regression
CSAM(Communications for Statistical Applications and Methods)
2018 .09
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