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논문 기본 정보

자료유형
학술대회자료
저자정보
Toui Ogawa (Kyushu Institute of Technology) Humin Lu (Kyushu Institute of Technology) Akihiko Watanabe (Kyushu Institute of Technology) Ichiro Omura (Kyushu Institute of Technology) Tohru Kamiya (Kyushu Institute of Technology)
저널정보
제어로봇시스템학회 제어로봇시스템학회 국제학술대회 논문집 ICCAS 2020
발행연도
2020.10
수록면
415 - 418 (4page)

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초록· 키워드

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Power devices are semiconductor devices that handle high voltages and large currents, which are used in electric vehicles, televisions, and trains. Therefore, high reliability and safety are required, and to ensure this, power cycle tests are performed to analyze the breakdown process. Conventional tests are often difficult to analyze due to the influence of sparks generated during the test. Therefore, new tests are being developed by adding ultrasound to conventional methods. The new technology is capable of continuously recording structural changes inside the device during testing, which is expected to make testing much easier than conventional testing. However, the new technology still has some challenges. The main problems are the lack of a method for analyzing large amounts of image data and the extraction of small changes in image features that are difficult to distinguish with the human eye, and the establishment of such a system is required. In this paper, we use deep learning for image classification of the obtained ultrasound images. We propose a new network model with the addition of Batch normalization and Global average pooling to VGG16, which is a pre-trained model. In the experiment, accuracy=98.29%, TPR=98.96% and FPR=7.43% classification accuracy was obtained.

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Abstract
1. INTRODUCTION
2. METHOD
3. EXPERIMENT
4. DISCUSSION
5. CONCLUSION
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UCI(KEPA) : I410-ECN-0101-2020-003-001570286