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학술저널
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한국전기전자재료학회 Transactions on Electrical and Electronic Materials Transactions on Electrical and Electronic Materials 제11권 제4호
발행연도
2010.1
수록면
170 - 173 (4page)

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Nanocrystalline cadmium sulfide (CdS) thin films were prepared using chemical bath deposition in a solution bath containing CdSO4, SC(NH2)2, and NH4OH. The CdS thin films were investigated using X-ray diffraction (XRD), photoluminescence (PL), and Fourier transform infrared spectroscopy (FTIR). The as-deposited CdS thin film prepared at 80°C for 60 min had a cubic phase with homogeneous and small grains. In the PL spectrum of the 2,900 Å-thick CdS thin film, the broad red band around 1.7 eV and the broad high-energy band around 2.7 eV are attributed to the S vacancy and the band-to-band transition, respectively. As the deposition time increases to over 90 min, the PL intensity from the band-to-band transition significantly increases. The temperature dependence of the PL intensity for the CdS thin films was studied from 16 to 300 K. The EA and EB activation energies are obtained by fitting the temperature dependence of the PL intensity. The EA and EB are caused by the deep trap and shallow surface traps, respectively. From the FTIR analysis of the CdS thin films, a broad absorption band of the OH stretching vibration in the range 3,000-3,600 cm-1 and the peak of the CN stretching vibration at 2,000 cm-1 were found.

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