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논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 발행연도
- 2015.11
- 수록면
- 567 - 570 (4page)
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Starting from graphene, “atomically thin 2-D materials” has become one of the most popular research areas for the next industrial revolution. From electronic charge carrier mobility [1] to thermal conductivity [2], the physical properties of these 2-D materials are completely different from those of bulk materials, even though made from the same atomic element.
One of the most promising and feasible applications of 2-D materials is that for transparent electrodes to replace the currently adopted but relatively expensive indium tin oxide (ITO), and still the most competent candidate is graphene and its derivatives. For these applications, not only electrical but also optical characterization is critical. However, the methods to measure optical properties of graphene [3-12] are imperfect yet, in terms of the availability, robustness, and accuracy. Moreover, there is no report on the proper optical properties measurement method for doped graphene by foreign atoms.
In this work, two optical measurements, surface plasmon resonance (SPR) and attenuated total reflection (ATR), have been conducted in parallel, to measure the complex refractive index (RI) of graphene layers. The graphene layers are synthesized by chemical vapor deposition (CVD) and transferred onto glass or gold substrates. Comparison of theoretical calculation results with the experimental data can determine the optical properties, i.e. complex refractive indices, of the graphene layers uniquely.
One of the most promising and feasible applications of 2-D materials is that for transparent electrodes to replace the currently adopted but relatively expensive indium tin oxide (ITO), and still the most competent candidate is graphene and its derivatives. For these applications, not only electrical but also optical characterization is critical. However, the methods to measure optical properties of graphene [3-12] are imperfect yet, in terms of the availability, robustness, and accuracy. Moreover, there is no report on the proper optical properties measurement method for doped graphene by foreign atoms.
In this work, two optical measurements, surface plasmon resonance (SPR) and attenuated total reflection (ATR), have been conducted in parallel, to measure the complex refractive index (RI) of graphene layers. The graphene layers are synthesized by chemical vapor deposition (CVD) and transferred onto glass or gold substrates. Comparison of theoretical calculation results with the experimental data can determine the optical properties, i.e. complex refractive indices, of the graphene layers uniquely.
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UCI(KEPA) : I410-ECN-0101-2016-550-002181939