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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.12 No.3
- 발행연도
- 2012.9
- 수록면
- 331 - 340 (10page)
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초록· 키워드
오류제보하기
In the deep sub-micron ICs, growing amounts of on-die memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. Spare columns are often included in memories to repair defective cells or bit lines during production test. In many cases, the repair process will not use all spare columns. Schemes have been proposed to exploit these unused spare columns to store additional check bits which can be used to reduce the miscorrection probability for triple errors in single error correction?double error detection (SEC-DED). These additional check bits increase the dimensions of the parity check matrix (H-matrix) requiring extra area overhead. A method is proposed in this paper to efficiently fill the extra rows of the H-matrix on the basis of similarity of logic between the other rows. Optimization of the whole Hmatrix is accomplished through logic sharing within a feasible operating time resulting in reduced area overhead. A detailed implementation using fuse technology is also proposed in this paper.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. BACKGROUND
Ⅲ. PROPOSED METHODS
Ⅳ. EXPERIMENTAL RESULTS
Ⅴ. CONCLUSIONS
ACKNOWLEDGMENTS
REFERENCES
참고문헌 (13)
참고문헌 신청
1. [학술대회논문] - U. Schlichtmann / 2002 / Tomorrows high-quality SoCs require high-quality embedded memories today / International Symposium on Quality Electronic Design
2. [학술지(정기간행물)] - Jeong-In Park / 2010 / High-Speed Low-Complexity Reed-Solomon Decoder using Pipelined Berlekamp-Massey Algorithm and Its Folded Architecture / JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 10 (3) : 193 ~ 202
3. [학술지(정기간행물)] - R. Hamming / 1950 / Error Correcting and Error Detecting Codes / Bell Sys. Tech. Journal 29 : 147 ~ 160
4. [학술지(정기간행물)] - M. Y. Hsiao / 1970 / A Class of Optimal Minimum Oddweight-column SEC-DED codes / IBM Journal of Research and Development 14 : 395 ~ 401
5. [학술대회논문] - M. Richter / 2008 / New Linear SEC-DED Codes with Reduced Triple Error Miscorrection Probability / Proc. of International On-Line Testing Symposium : 37 ~ 42
2. [학술지(정기간행물)] - Jeong-In Park / 2010 / High-Speed Low-Complexity Reed-Solomon Decoder using Pipelined Berlekamp-Massey Algorithm and Its Folded Architecture / JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 10 (3) : 193 ~ 202
3. [학술지(정기간행물)] - R. Hamming / 1950 / Error Correcting and Error Detecting Codes / Bell Sys. Tech. Journal 29 : 147 ~ 160
4. [학술지(정기간행물)] - M. Y. Hsiao / 1970 / A Class of Optimal Minimum Oddweight-column SEC-DED codes / IBM Journal of Research and Development 14 : 395 ~ 401
5. [학술대회논문] - M. Richter / 2008 / New Linear SEC-DED Codes with Reduced Triple Error Miscorrection Probability / Proc. of International On-Line Testing Symposium : 37 ~ 42
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