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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2005.6
- 수록면
- 13 - 16 (4page)
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초록· 키워드
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Friction characteristics at nano-scale of self-assembled monolayers (SAMs) having different chain lengths and end groups were experimentally studied. In order to understand the effect of the chain length and end group on the nano-scale friction: (1) two different SAMs of shorter chain lengths with different end groups such as methyl and phenyl groups, and (2) four different kinds of SAMs having long chain lengths (C10) with end groups of fluorine and hydrogen were coated on silicon wafer (100) by dipping method and Chemical Vapour Deposition (CVD) technique. Their nano-scale friction was measured using an Atomic Force Microscopy (AFM) in the range of 0.40 nN normal loads. Measurements were conducted at the scanning speed of 2㎛/s for the scan size of 1㎛ × 1㎛ using a contact mode type Si₃N₄ tip (NPS 20) that had a nominal spring constant 0.58 N/m. All experiments were conducted at ambient temperature (24 ± 1℃) and relative humidity (45 ± 5 %). Results showed that the friction force increased with applied normal load for all samples, and that the silicon wafer exhibited highest friction when compared to SAMs. While friction was affected by the inherent adhesion in silicon wafer, it was influenced by the chain length and end group in the SAMs. It was observed that the nano-friction decreased with the chain length in SAMs. In the case of monolayers with shorter length, the one with the phenyl group exhibited higher friction owing to the presence of benzene rings that are stiffer in nature. In the case of SAMs with longer chain length, those with fluorine showed friction values relatively higher than those of hydrogen. The increase in friction due to the presence of fluorine group has been discussed with respect to the size of the fluorine atom.
목차
Abstract
Introduction
Experimental
Results and Discussion
Conclusions
Acknowledgement
References
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UCI(KEPA) : I410-ECN-0101-2009-551-018204372