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ContentsAbstract ········································ ⅠContents ········································ ⅣList of Tables and Figures ··············· ⅦAbbreviations ···································· ⅩⅨChapter 1. Introduction ························ 11.1 References······················································· 5Chapter 2. Literature Review and Theories··· 72.1 Thin Film Transistor(TFT):Definition and its theories·7 2.1.1 Structure of TFT··········································· 92.1.2 Operation of TFT·········································· 13 2.1.3 Parameters of TFT········································ 152.2 Trends and issues of TFT···································· 202.3 Oxide materials for TFT ····································· 222.3.1 Oxide semiconductor ······································ 222.3.2 Oxide gate insulator ······································ 252.4 Solution processed zinc oxide for TFT ···················· 282.5 Importance of interface engineering ························ 302.6 References ······················································ 32Chapter 3. Experimental Procedure··············343.1 Materials························································· 343.2 Patterning methods of ZnO semiconductors··············· 373.3 Interface Engineering ········································· 393.4 TFT Fabrication ····················································· 403.5 Characterization ··············································· 443.6 References ···················································· 46Chapter 4. Polymer Pre-Pattern and Binary Solvent Developing for ZnO-Based TFT········474.1 Introduction ······················································474.2 Patterning method for ZnO TFT ························494.3 Binary solvent mixture: toluene?methanol mixture···524.4 Bond breakage of PMMA : Pre-patterned substrates·564.5 Electrical characteristics ···································604.6 Flexible TTFT with polymer dielectric layer ··········674.7 References ·······················································72Chapter 5. Doping Mechanism and Integration for High Electrical Performance of Inorganic TFT ···············································755.1 Introduction ······················································755.2 Alkali metal doping for solution-processed ZnO·······785.3 Ionic amorphous dielectric layer for ZnO TFTs·······815.4 Electrical characteristics of integrated metal oxide TFT ································································875.5 Water adsorption effects of ionic amorphous dielectric layer··························································985.6 References·······················································107Chapter 6. Interface Engineering for Suppression of Flat-Band Voltage Shift in ZnO Semiconductor /Polymer Dielectric Thin Film Transistor········1106.1 Introduction ····················································1106.2 Fabrication method for a self-assembled inorganic layer (SAIL) ·····················································1126.3 The interface engineering effect with stable electrical performance by SAIL ·············································1176.4 Analytic model for suppression of flat band shift···1286.5 Flexible bending test of ZnO/SAIL/PVP TFTs ·····1346.6 References ······················································138Chapter 7. Patterning by Interface Engineering ·····················································1407.1 Introduction·······················································1407.2 Low-temperature process through ligand extraction by methanol······················································1427.3 Patterning: interface engineering using selective photoinduced transformation ·····························1447.4 Analysis of Na doped ZnO by X-ray photoelectron spectroscopy (XPS) ······································1547.5 Electrical characteristics ··································1617.6 References ·······················································169Chapter 8. Conclusion·························· 172Appendix········································· 176초록(국문) ······································· 186
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