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논문 기본 정보

자료유형
학술저널
저자정보
Prakash T. (National Centre for Nanoscience and Nanotechnology, University of Madras, Guindy Campus, Chennai) Karnan C. (Department of Physics, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences (SIMATS), Chennai) Kanagathara N. (Department of Physics, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences (SIMATS), Chennai) Karthieka R.R. (National Centre for Nanoscience and Nanotechnology, University of Madras, Guindy Campus, Chennai) Ajith Kumar B.S. (National Centre for Nanoscience and Nanotechnology, University of Madras, Guindy Campus, Chennai) Prabhaharan M. (Department of Physics, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences (SIMATS), Chennai)
저널정보
한국원자력학회 Nuclear Engineering and Technology Nuclear Engineering and Technology Vol.56 No.6
발행연도
2024.6
수록면
2,190 - 2,194 (5page)
DOI
10.1016/j.net.2024.01.028

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The study investigates the dose-dependent direct X-ray sensing characteristics of Brucinium benzilate (BB) and Nacetylglycine (NAG) organic crystals. BB and NAG were prepared as a slurry and deposited as a thick film on a patterned metal electrode. The X-ray induced photocurrent response was examined for various exposure doses using an intraoral pulsed 70 keV X-ray machine connected to a source meter. Subsequently, the morphological properties and thickness of the thick films were analyzed using scanning electron microscopy (SEM). At a photon energy of 70 keV, the attenuation coefficient values for NAG and BB crystals were determined to be approximately 0.181 and 0.178 cm2/g, respectively. The X-ray stopping power of the crystals was measured using a suniray-2 X-ray imaging system. To evaluate the responsiveness of the sensors, the photocurrent sensitivity and noise equivalent dose rate (NED) were calculated for both thick films. The findings demonstrated a noteworthy capability of sensing low doses (mGy), thereby suggesting the potential application of these organic materials in X-ray sensor development.

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