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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2019.2
- 수록면
- 16 - 21 (6page)
이용수
초록· 키워드
오류제보하기
We present a broad-bandwidth comb-spacing-swept source (CSWS) based on a differential polarization delay line (DPDL) for interferometric three-dimensional (3D) imaging. The comb spacing of the CSWS is repeatedly swept by the tunable DPDL in the multiwavelength source to provide depth-scanning optical coherence tomography (OCT). As the polarization differential delay of the DPDL is tuned from 5 to 15 ps, the comb spacing along the wavelength continuously varies from 1.6 to 0.53 nm, respectively. The wavelength range of various semiconductor optical amplifiers and the cavity feedback ratio of the tunable fiber coupler are experimentally selected to obtain optimal conditions for a broader 3-dB bandwidth of the multiwavelength spectrum and thus provide a higher axial resolution of 35 μm in interferometric OCT imaging. The proposed CSWS-OCT has a simple imaging interferometer configuration without reference-path scanning and a simple imaging process without the complex Fourier transform. 3D surface images of a via-hole structure on a printed circuit board and the top surface of a coin were acquired.
목차
I. INTRODUCTION
II. PRINCIPLE
III. EXPERIMENTAL SETUP
IV. RESULTS
V. CONCLUSION
REFERENCES
참고문헌 (14)
참고문헌 신청
L. Deck / 1994 / High-speed noncontact profiler based on scanning white-light interferometry / Appl. Opt 33:7334~7338
B. Lee / 1990 / Profilometry with a coherence scanning microscope / Appl. Opt 29:3784~3788
L. L. Deck / 2003 / Fourier-transform phase-shifting interferometry / Appl. Opt 42:2354~2365
Y. S. Ghim / 2009 / Spectrally resolved whitelight interferometry for 3D inspection of a thin-film layer structure / Appl. Opt 48:799~803
Z. He / 1999 / Synthesized optical coherence tomography for imaging of scattering objects by use of a stepwise frequency-modulated tunable laser diode / Opt. Lett 24:1502~1504
B. Lee / 1990 / Profilometry with a coherence scanning microscope / Appl. Opt 29:3784~3788
L. L. Deck / 2003 / Fourier-transform phase-shifting interferometry / Appl. Opt 42:2354~2365
Y. S. Ghim / 2009 / Spectrally resolved whitelight interferometry for 3D inspection of a thin-film layer structure / Appl. Opt 48:799~803
Z. He / 1999 / Synthesized optical coherence tomography for imaging of scattering objects by use of a stepwise frequency-modulated tunable laser diode / Opt. Lett 24:1502~1504
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