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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.22 No.2
- 발행연도
- 2022.4
- 수록면
- 69 - 83 (15page)
- DOI
- 10.5573/JSTS.2022.22.2.69
이용수
초록· 키워드
오류제보하기
With the development of microelectronics technology, the feature size of integrated circuit continues to shrink, and circuit performance has been improved. At the same time, however, factors such as process disturbance, power noise, and particle radiation are having an increasingly serious influence on the Failure Probability of Circuits (FPC). Searching the input vectors that are sensitive to FPC can assist circuit designers in selectively reinforcing the circuit to reduce the fault-tolerant overhead and improve the fault-tolerant efficiency. In this paper, an Improved Adaptive Cuckoo Search (IACS) algorithm is proposed to search sensitive circuit vectors. The vector segmentation strategy is used to change the dimension of the input vector, the hill climbing algorithm is used to improve the quality of the initial population, and the adaptive strategy is used to control parameters such as power-law index, discovery probability and scaling factor. At the same time, a Correlation Separation Approach (COSEA) is proposed to calculate the FPC under specific vector excitation. Experimental results show that the proposed algorithm has higher accuracy and better efficiency compared with existing algorithms.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. CORRELATION SEPARATION APPROACH
Ⅲ. BASIC CUCKOO ALGORITHM
Ⅳ. IMPROVED ADAPTIVE CUCKOO ALGORITHM AND SENSITIVE VECTOR SEARCH
Ⅴ. EXPERIMENTAL RESULTS AND ANALYSIS
Ⅵ. CONCLUSION
REFERENCES
참고문헌 (21)
참고문헌 신청
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J. D. Meindl, Q. Chen, and J. A. Davis, “Limits on Silicon Nanoelectronics for Terascale Integration,” Science, Vol. 293, No. 5537, pp. 2044-2049, Sep., 2001.
J. K. Lorenz, et al, "Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results," IEEE transactions on electron devices, Vol. 58, No. 8, pp. 2227-2234, Aug., 2011.
N. R. Shanbhag, et al, “The Search for Alternative Computational Paradigms,” IEEE Design & Test of Computers, Vol. 25, No. 4, pp. 334-343, July-Aug., 2008.
J. Xiao, W. Lee, J. Jiang, and X. Yang, “Circuit reliability estimation based on an iterative PTM model with hybrid coding”, Microelectronics Journal, Vol. 52, No. 8, pp. 117-123, 2016.
J. D. Meindl, Q. Chen, and J. A. Davis, “Limits on Silicon Nanoelectronics for Terascale Integration,” Science, Vol. 293, No. 5537, pp. 2044-2049, Sep., 2001.
J. K. Lorenz, et al, "Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results," IEEE transactions on electron devices, Vol. 58, No. 8, pp. 2227-2234, Aug., 2011.
N. R. Shanbhag, et al, “The Search for Alternative Computational Paradigms,” IEEE Design & Test of Computers, Vol. 25, No. 4, pp. 334-343, July-Aug., 2008.
J. Xiao, W. Lee, J. Jiang, and X. Yang, “Circuit reliability estimation based on an iterative PTM model with hybrid coding”, Microelectronics Journal, Vol. 52, No. 8, pp. 117-123, 2016.
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