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논문 기본 정보

자료유형
학술저널
저자정보
노태범 (경북대학교) 김대현 (경북대학교)
저널정보
한국센서학회 센서학회지 센서학회지 제29권 제5호
발행연도
2020.1
수록면
324 - 327 (4page)

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초록· 키워드

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The impact of output conductance (go) on the short-circuit current-gain cut-off frequency (fT) in In0.8Ga0.2As high-electron-mobilitytransistors (HEMTs) on an InP substrate was investigated. An attempted was made to extract the values of fT in a simplified small-signalmodel (SSM) of the HEMTs, derive an analytical formula for fT in terms of the extrinsic model parameters of the simplified SSM, whichare related to the intrinsic model parameters of a general SSM, and verify its validity for devices with Lg from 260 to 25 nm. In longchanneldevices, the effect of the intrinsic output conductance (goi) on fT was negligible. This was because, from the simplified SSMperspective, three model parameters, such as gm_ext, Cgs_ext and Cgd_ext, were weakly dependent on goi. However, in short-channel devices,goi was found to play a significant role in degrading fT as Lg was scaled down. The increase in goi in short-channel devices caused aconsiderable reduction in gm_ext and an overall increase in the total extrinsic gate capacitance, yielding a decrease in fT with goi. Finally,the results were used to infer how fT is influenced by goi in HEMTs, emphasizing that improving electrostatic integrity is also criticalimportance to benefit fully from scaling down Lg.

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