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논문 기본 정보

자료유형
학술저널
저자정보
Jang, B.T. (KEPCO Research Institute, Korea Electric Power Corporation) Alidu, A. (KEPCO Research Institute, Korea Electric Power Corporation) Kim, N.D. (KEPCO Research Institute, Korea Electric Power Corporation)
저널정보
한국전력공사 KEPCO Journal on electric power and energy KEPCO Journal on electric power and energy 제3권 제2호
발행연도
2017.1
수록면
89 - 97 (9page)

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The substation is a critical node in the power network where power is transformed in the power generation, transmission and distribution system. The IEC 61850 is a global standard which proposes efficient substation automation by defining interoperable communication and data modelling techniques. In order to achieve this level of interoperability and automation, the IEC 61850 (Part 6) defines System Configuration description Language (SCL). The SCL is an XML based file format for defining the abstract model of primary and secondary substation equipment, communications systems and also the relationship between them. It enables the interoperable exchange of data during substation engineering by standardizing the description of applications at different stages of the engineering process. To achieve the seamless interoperability, multi-vendor devices are required to adhere completely to the IEC 61850. This paper proposes an efficient algorithm required for verifying the interoperability of multi-vendor devices by checking the adherence of the SCL file to specifications of the standard. Our proposed SCL validation algorithm consists of schema validation and other functionalities including information model validation using UML data model, the Vendor Defined Extension model validation, the User Defined Rule validation and the IED Engineering Table (IET) consistency validation. It also integrates the standard UCAIUG (Utility Communication Architecture International Users Group) Procedure validation for quality assurance testing. Our proposed algorithm is not only flexible and efficient in terms of ensuring interoperable functionality of tested devices, it is also convenient for use by system integrators and test engineers.

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