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학술저널
저자정보
Kamada, Hirokazu (Department of Electrical Engineering, Nagaoka University of Technology) Ihara, Ikuo (Department of Mechanical Engineering, Nagaoka University of Technology) Kim, Hong-Dae (Department of Electrical Engineering, Nagaoka University of Technology) Nakayama, Tadachika (Department of Electrical Engineering, Nagaoka University of Technology) Kimura, Munehiro (Department of Electrical Engineering, Nagaoka University of Technology) Akahane, Tadashi (Department of Electrical Engineering, Nagaoka University of Technology)
저널정보
한국정보디스플레이학회 Journal of information display Journal of information display 제12권 제4호
발행연도
2011.1
수록면
173 - 177 (5page)

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The alignment film abrasion caused by the rubbing process was quantitatively evaluated via atomic-force microscopy (AFM). First, a patterned alignment film structure, which was molded through the imprint method, was artificially formed. Then, the surface topography of the alignment film was evaluated via AFM after rubbing, and the degree of abrasion of the alignment film was estimated by subtracting the value after rubbing from the value before rubbing. It was recognized that the degree of abrasion increased with an increase in the rubbing strength. The relationship between the number of rubbing cycles and the degree of abrasion of the alignment film was also estimated.

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