지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2012.1
- 수록면
- 111 - 120 (10page)
이용수
초록· 키워드
오류제보하기
Built-In-Test is a design feature in more and more advanced weapon system. During development test and evaluation(DT&E) it is critical that the BIT system be evaluated. The BIT system is an integral part of the weapon system and subsystem. Built-In-Test assists in conducting on system and subsystem failure detection and isolation to the Line Replaceable Unit(LRU). This capability reduces the need for highly skilled personnel and special test equipment at organizational level, and reduces maintenance down-time of system by shortening Total Corrective Maintenance Time. During DT&E of weapon system the objective of BIT system evaluation is to determine BIT capabilities achieved and to identify deficiencies in the BIT system. As a result corrective actions are implemented while the system is still in development. Through the use of the reiterative BIT evaluation the BIT system design was corrected, improved, or updated, as the BIT system matured.
목차
등록된 정보가 없습니다.
참고문헌 (15)
참고문헌 신청
James V. Jones / 2006 / ILS Handbook, Second Edition :4.1
Dario R. Beniquez / 1995 / BIT Adequacy-Evaluation Methodology For Air-Vehicle System / Proceedings Annual Reliability and Maintainability Symposium
1985 / Testability Program for Electronic System and Equipment / MIL-STD-2165
1973 / Maintainability Verification/ Demonstration/Evaluation / MIL-STD-471
James V. Jones / 2006 / ILS Handbook, Second Edition :3~12
Dario R. Beniquez / 1995 / BIT Adequacy-Evaluation Methodology For Air-Vehicle System / Proceedings Annual Reliability and Maintainability Symposium
1985 / Testability Program for Electronic System and Equipment / MIL-STD-2165
1973 / Maintainability Verification/ Demonstration/Evaluation / MIL-STD-471
James V. Jones / 2006 / ILS Handbook, Second Edition :3~12
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