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논문 기본 정보

자료유형
학술대회자료
저자정보
Kim, Young-Kyoo (Display Technology Center, Institute for Advanced Engineering) Park, Seong-Sik (R&D Center, Orion Electric Corporation) Jung, Young-Yi (Display Technology Center, Institute for Advanced Engineering) Han, Ki-Jong (Display Technology Center, Institute for Advanced Engineering, Department of Molecular Science and Engineering, Ajou University) Lee, Jae-Gyoung (Display Technology Center, Institute for Advanced Engineering, Department of Molecular Science and Engineering, Ajou University) Hwang, Ha-Keun (Display Technology Center, Institute for Advanced Engineering) Choi, Dong-Kwon (Display Technology Center, Institute for Advanced Engineering) Keum, Ji-Hwan (Display Technology Center, Institute for Advanced Engineering) Im, Woo-Bin (R&D Center, Orion Electric Corporation) Lee, Hyo-Jung (Display Technology Center, Institute for Advanced Engineering, Department of Molecular Science and Engineering, Ajou University) Lee, Hyung-Sik (Display Technology Center, Institute for Advanced Engineering) Kim, Sun-Wook (Display Technology Center, Institute for Advanced Engineering, Department of Molecular Science and Engineering, Ajou University)
저널정보
한국정보디스플레이학회 한국정보디스플레이학회 학술대회 한국정보디스플레이학회 2000년도 제1회 학술대회 논문집
발행연도
2000.1
수록면
205 - 206 (2page)

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초록· 키워드

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The capacitance-temperature (C-T) measurement technique is proposed in the present work to investigate the thermal stability of organic and polymeric thin films for organic electroluminescent display (OELD). The single layer devices with the individual materials were subjected to the C-T measurement, prior to the examination of the complete OELD. The single layer devices with the small molecules destroyed below $180\;^{\circ}C$ depending on the kinds of materials. However, the device with the hole-transporting polyimide did not show any relaxation up to $200\;^{\circ}C$. The small molecule based OELDs failed to emit light after annealing, whereas that with the hole-transporting polyimide worked well in spite of large reduction in intensity.

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