Reduction of surface roughness during high speed thinning of silicon wafer

W. Heo ,  J. H. Ahn ,  N.-E. Lee

한국진공학회 학술발표회초록집

2010 .02

Effect of surface cleaning for laser texturing of mc-silicon wafer

Seung Hyun HA ,  Hee Soo KIM ,  Gi Ryoung MAENG 외 1명

한국진공학회 학술발표회초록집

2016 .08

Micro-Raman spectroscopy analysis for single crystal silicon using scratching test

정성민 ,  오한석 ,  박성은 외 1명

한국결정학회 학술연구발표회

2001 .01

Evidence for U Magnetism in UFe_xAl_12-x (x = 5, 6) from Magnetization Study on Single Crystals

Evgeniya A. Te ,  eshina ,  Alexande 외 4명

한국자기학회 학술연구발표회 논문개요집

2010 .12

The Fabrication of the Single Crystal Wire from Cu Single Crystal Grown by Czochralski Method and Its Physical Properties

정세영

한국결정학회 학술연구발표회

2005 .01

Optical Characterization of Cubic and Pseudo-cubic Phase Perovskite Single Crystals Depending on Laser Irradiation Time

Hye Ryung Byun ,  Mun Seok Jeong

Applied Science and Convergence Technology

2018 .03

A Simple and Rapid Method for Species and Faces Identification of Silicon Wafers using WD-XRF

K. B. Dasa ,  i ,  Hani Baek 외 1명

한국분석과학회 학술대회

2020 .06

Uniform texturing of crystalline silicon wafer through different surfactants add for solar cell fabrication

Hyunsung KIM ,  Sunyong KIM ,  Youngseok LEE 외 2명

한국진공학회 학술발표회초록집

2016 .08

A Study on Quick Detection of Variance Change Point of Time Series under Harsh Conditions

Hyun Seok Choi ,  Sung Hwan Choi ,  Tae Yoon Kim

한국데이터정보과학회지

2006 .12

Reactions between silicon precursors and surface sites during atomic layer deposition of silicon nitride

Luchana L. YUSUP ,  Jae-Min PARK ,  Ti 외 5명

한국진공학회 학술발표회초록집

2016 .08

Automatic defect review AFM applications from euv photomask reticles to silicon crystal defects on 300 mm wafer

Jong-Hyeok PARK ,  Ahjin JO ,  Byoung-Woon AHN 외 5명

한국진공학회 학술발표회초록집

2016 .08

Magnetic and Electric Properties of Mn_1-xFe_xWO₄ Single Crystal

Dong Hyeok Choi ,  Seung Je Moon ,  Sung Baek Kim 외 3명

한국자기학회 학술연구발표회 논문개요집

2008 .12

The Growth and Characterization of Piezoelectric Single Crystals

신민철 ,  박찬석 ,  정수진 외 2명

한국결정학회 학술연구발표회

2001 .01

Measurement of the Particle Current Changes Associated with the Flatness of Deflector Mesh Surface in Particle Beam Mass Spectrometer System

Dongbin Kim ,  TaeWan Kim ,  Yinhua Jin 외 5명

Applied Science and Convergence Technology

2016 .03

Top-Silicon thickness effect of Silicon-On-Insulator substrate on capacitorless dynamic random access memory cell application

정승민 ,  김민수 ,  조원주

한국진공학회 학술발표회초록집

2010 .02