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논문 기본 정보

자료유형
학술저널
저자정보
Faisal Iqbal (Korea University of Technology and Education) Hussamud Din (Korea University of Technology and Education) Byeungleul Lee (Korea University of Technology and Education)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.19 No.6
발행연도
2019.12
수록면
600 - 607 (8page)
DOI
10.5573/JSTS.2019.19.6.600

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초록· 키워드

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Recently, the demand for microelectromechanical systems (MEMS) based inertial sensors has been increased due to a wide range of application in consumer electronics; however, high volume production remains a major challenge for the MEMS industry. This paper proposes a new three dimensional (3-D) test methodology for the time-efficient evaluation of multi-axis MEMS gyroscopes. A mathematical model for the proposed 3-D test method was derived based on the coordinates transformation. The 3-D test methodology was validated experimentally using three-axis MEMS gyroscope from ST Microelectronics and the results were compared with the conventional one dimensional (1-D) test method. The experimental results revealed that the measurement error between the conventional 1-D and the proposed 3-D test was less than 1%, whereas the test time was decreased three times. Finally, the error sources and limitations of the proposed 3-D test method was highlighted.

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Abstract
Ⅰ. INTRODUCTION
Ⅱ. METHODOLOGY
Ⅲ. EXPERIMENTAL RESULTS AND DISCUSSION
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