Electrical properties and microstructure of zno varistor with high surge protective characteristics

Seung-Hwan Lee; Jung Rag Yoon; Chang-Gil Shon; Apand Djafar; Moon-Taek Cho

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자료유형: 학술저널

저자정보: Seung-Hwan Lee Jung Rag Yoon Chang-Gil Shon Apand Djafar Moon-Taek Cho

저널정보: 한양대학교 세라믹공정연구센터 Journal of Ceramic Processing Research Journal of Ceramic Processing Research 제20권 제2호

발행연도: 2019.1

수록면: 164 - 168 (5page)

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We fabricated ZnO-Bi2O3-Sb2O3-Al2O3-CoO-NiO varistor and investigated the effect of sintering temperature on itsmicrostructures and electrical properties. As the sintering temperature increases, crystalline grain growth and phase changeare observed owing to the volatilization of Bi2O3. The varistor voltage decreased from 280 V/mm to 195 V/mm with theincrease in sintering temperature, and the nonlinear coefficient (α) and leakage current of the varistor sintered at 1120 oC were42.3 and 2.8 μA, respectively. For the varistor sintered at 1120 oC, the surface temperature and current increased from 45.3 oCto 87.9 oC and from 2.8 kA to 7.44 kA, respectively, under the surge voltage (waveform of 1.2/50 ms) of 6 kV to 15 kV. According to a repeated surge test (waveform: 1.2/50 ms and 8/20 ms, surge voltage 6.6 kV/3 kA, interval: 60 s), the varistorexhibited excellent surge-withstanding capability with the variation rate of voltage 0.8% and the variation rate of leakagecurrent within 1.5%.

참고문헌 (9)

참고문헌 신청

M. Peiteado / 2007 / Journal of the European Ceramic Society 27:3867

H. Zhao / 2016 / Materials Letters 164:80

윤중락 / 2009 / Voltage Enhancement of ZnO Oxide Varistors for Various Y2O3 Doping Compositions / Transactions on Electrical and Electronic Materials 10(5):152~155

남춘우 / 2015 / Sintering Effect on Clamping Characteristics and Pulse Aging Behavior of ESD-Sensitive V2O5/Mn3O4/Nb2O5 Codoped Zinc Oxide Varistors / Transactions on Electrical and Electronic Materials 16(6):308~311

2012 / KS C IEC 61643-11; Low-voltage surge protective devices-Part 11:Surge protective devices connected to low-voltage power systems-Requirements and test methods

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