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자료유형
학술저널
저자정보
B. H. Bononi dos Santos (Universidade Federal de São Carlos (UFSCAR)) Y Galvão Gobato (Universidade Federal de São Carlos (UFSCAR)) M. Henini (University of Nottingham)
저널정보
한국진공학회(ASCT) Applied Science and Convergence Technology Applied Science and Convergence Technology Vol.23 No.5
발행연도
2014.9
수록면
211 - 220 (10page)

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초록· 키워드

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In this paper, we present a review of optical and structural studies of GaBixAs1-x epilayers grown by Molecular Beam Epitaxy (MBE) on (311)B and (001) GaAs substrates with different As fluxes. The results indicate that under near-stoichiometric conditions the bismuth incorporation is higher for samples grown on (311)B GaAs substrates than for those grown on (001) GaAs. In addition, carrier localization effects in GaBiAs layers are clearly revealed for both samples by optical measurements. The (311)B samples showed evidence of higher density of defects. It has also been found that the nonradiative centers play a significant role in the recombination process in this material system. The influence of post-growth annealing on the microstructural, optical, and magneto-optical properties was also investigated. An important improvement of optical and spin properties after thermal annealing due to the reduction of defects in the GaBiAs layers was observed.

목차

Ⅰ. Introduction
Ⅱ. Structural Properties
Ⅲ. Optical Properties
Ⅳ. Thermal Annealing Effects
Ⅴ. Magneto-Optical Properties
Ⅵ. Conclusion
References

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