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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 한국진공학회(ASCT) Journal of Korean Vacuum Science & Technology Journal of Korean Vacuum Science & Technology Vol.5 No.1
- 발행연도
- 2001.7
- 수록면
- 7 - 10 (4page)
이용수
이 논문의 연구 히스토리 (2)
2001
Ion Induced Secondary Electron Emission of MgO with Patterned Gold Line Charge Neutralization
Jong-Wan Lee
,
Kie-Young Lee
,
Hong-Gyu Kim
외 4명
Journal of Korean Vacuum Science & Technology
2001.07
학술저널
Ion Induced Secondary Electron Emission of MgO with Patterned Gold Line Charge Neutralization
Jong-Wan Lee
,
Kie-Young Lee
,
Honggyu Kim
외 4명
한국진공학회 학술발표회초록집
2001.02
학술대회자료
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- 이 논문의 연구 히스토리 확인하기
초록· 키워드
오류제보하기
Ion induced secondary electron emission coefficients γ of protecting layers of an AC plasma display panel(AC-PDP) have been measured. In order to solve the surface charging effect during the measurement at insulating samples like MgO, a new method with the patterned gold line charge neutralization has been introduced. The measurement was performed at the samples, MgO and MgO+MgF₂, which showed a great difference in the firing voltage between the two protecting layers. The γ value has been compared with the firing voltage V_f of the AC-PDP with the same protecting layer. Correct relationship between γ and V_f has been observed. Thus, the patterned gold line method has been proven to be successful for the measurement of the secondary electron emission yield at insulator sample surfaces.
목차
Abstract
1. Introduction
2. Experiment
3. Results and Discussion
4. Summary
Acknowledgement
References
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Ion Induced Secondary Electron Emission of MgO with Patterned Gold Line Charge Neutralization
한국진공학회 학술발표회초록집
2001 .02
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Measurement of work - function and ion - induced secondary electron emission coefficient of MgO protective layer in AC - PDP
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Measurement of secondary electron emission coefficient and work function of MgO protective layer in AC PDP
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Measurement of ion - induced secondary electron emission coefficient, work function, and discharge voltage of MgO protective layer in AC - PDP for vacuum and air annealed
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Low-energy ion induced electron emission from MgO and Cs-doped MgO surfaces
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Influences of the degradation of MgO and phosphor on the ion - induced secondary electron emission coefficient and basic discharge characteristics in AC - PDP
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Influences of degradation of MgO and phosphor on ion - induced secondary electron emission coefficient(γ) and basic discharge characteristics in AC - PDP
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Improvement of secondary electron emission coefficient(γ) of the MgO film by O₂Plasma - Treatment
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Influence of N₂ gas mixing ratio on secondary electron emission coefficient of MgO single crystal and MgO protective layer
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Characteristics of secondary electron emission coefficient of MgO protective layer by annealing effect
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Influence of gas mixing ratio on secondary electron emission coefficient of MgO single crystal with different orientations and MgO protective layer
한국진공학회 학술발표회초록집
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Influence of vacuum annealing of MgO protective layer on secondary electron emission coefficient(γ) and luminous efficiency in AC - PDP
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UCI(KEPA) : I410-ECN-0101-2019-420-001259408