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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 한국진공학회(ASCT) Applied Science and Convergence Technology Applied Science and Convergence Technology Vol.26 No.2
- 발행연도
- 2017.3
- 수록면
- 21 - 25 (5page)
이용수
초록· 키워드
오류제보하기
The shape of the reflection spectrum is complex and appears to overlap with several signals, because the surface state is uneven due to the natural oxide film, so that the spectrum becomes a complicated signal shape divided into regions 1 and 2 due to diffuse reflection. On the other hand, it is seen that the reflection spectrum after PEO surface treatment is overlapped with several signals. In addition, the reflectance of the energy band varies from 1.32 to 1.46 eV. Usually, the MgO-type oxide film was observed at an energy band of ~4.2 eV. The thickness of the oxide film was increased as the DC voltage was increased by the thin film thickness meter (QuaNix; 7500M) after Plasma Electrolytic Oxidation (; PEO) surface treatment. This is because the higher the DC voltage, the easier the binding of the OH- ions in the solution solution and the Mg+ ions of the magnesium alloy. An important part of the bonding of ordinary ions is the energy source (plasma) which can promote bonding. However, when a certain threshold voltage or more is applied, the material is adversely affected. The oxide film of the surface may be destroyed without increasing the thickness of the oxide film, that is, whitening of the material may occur.
목차
Abstract
I. Introduction
II. Theory
III. Experiment
III. Results
IV. Conclusions
Reference
참고문헌 (9)
참고문헌 신청
B. L. Mordike, and T. Ebert (2001)., “Magnesium propertiesapplication - potential,” Materials Science & Engineering (A), 302, p 37.
K. Tokaji, M. Nakajima, and Y. Uematsu (2009)., “Fatigue Crack Propagation and Fracture Mechanisms of Wrought Magnesium Alloys in Different Enviro-nments,” International Journal of Fatigue, 31, p. 1137.
J. E. Gray, B. Luan, J. Alloys Compd. 336, p. 88.
G. E. Shahin, Minerals, Metals and Materials Society, Seattle, WA, United States, 2002, p. 263.
G. L. Makar, J. Kruger, J. Electrochem. Soc. 137 (1990) p. 414.
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