지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
초록· 키워드
오류제보하기
Dislocation density and distribution in epitaxial GaAs layer on Si are evaluated quantitatively and effectively using image processing of transmission electron microscopy image. In order to evaluate dislocation density and distribution, three methods are introduced based on line-intercept, line-length measurement and our coding with line-scanning method. Our coding method based on line-scanning is used to detect the dislocations line-by-line effectively by sweeping a thin line with the width of one pixel. The proposed method has advances in the evaluation of dislocation density and distribution. Dislocations can be detected automatically and continuously by a sweeping line in the code. Variation of dislocation density in epitaxial GaAs films can be precisely analyzed along the growth direction on the film.
목차
등록된 정보가 없습니다.
참고문헌 (6)
참고문헌 신청
Heuser B J / 1994 / Small-angle neutron scattering study of dislocations in deformed single-crystal copper / J. Appl. Cryst 28 : 1020 ~ 1029
Kawabe M / 1987 / Self-annihilation of antiphase boundary in GaAs on Si(100) grown by molecular beam epitaxy / Jpn. J. Appl. Phys 24 : 944 ~ 946
Kruml T / 2000 / Dislocation density in Ni3(Al, Hf) / Intermetallics 8 : 729 ~
Martin U / 1995 / The quantitative measurement of dislocation density in the transmission electron microscope / Parkt. Metallogr 32 : 467 ~
Moore G E / 1965 / Cramming more components onto integrated circuits / Electronics 38 : 114 ~
Kawabe M / 1987 / Self-annihilation of antiphase boundary in GaAs on Si(100) grown by molecular beam epitaxy / Jpn. J. Appl. Phys 24 : 944 ~ 946
Kruml T / 2000 / Dislocation density in Ni3(Al, Hf) / Intermetallics 8 : 729 ~
Martin U / 1995 / The quantitative measurement of dislocation density in the transmission electron microscope / Parkt. Metallogr 32 : 467 ~
Moore G E / 1965 / Cramming more components onto integrated circuits / Electronics 38 : 114 ~
이 논문의 저자 정보
최근 본 자료
댓글(0)
0