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An experimental comparison of the detection properties between imaging plate and film for recording the electron diffraction pattern was carried out on a radiation-sensitive material, an aluminum trihydroxide (gibbsite, γ-Al(OH)₃), through the electron beam irradiation. Because the imaging plate has a wide dynamic range sufficient for recording extremely low- and high-electron intensities, the range of spatial frequency for the diffraction pattern acquired by the imaging plate was extended to two times larger than the range by the film, especially at a low electron dose condition (‹0.1 e-/μm2). It is also demonstrated that the imaging plate showed better resolving power for discriminating fine intensity levels even in saturated transmitted beam. Hence, in the respect of investigating the structures of radiation-sensitive materials and cryobiological specimens, our experimental demonstrations suggest that the imaging plate technique may be a good choice for those studies, which have to use an extremely low electron intensity for recording.
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참고문헌 (28)
참고문헌 신청
Amemiya Y / 1988 / Imaging plate illuminates many fields / Nature 336 : 89 ~
Arami H / 2007 / Electron beam-induced “Nanocalcination” of boehmite nanostrips to mesoporous α-alumina phase / J Am Ceram Soc 90 : 3311 ~ 3313
DITABIS AG / / DITABIS imaging plate technology for all applications in transmission electron microscopy
Downing KH / 2008 / A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy / Rev Sci Instrum 79 : 043702 ~
Echlin P / 1992 / Low-temperature microscopy and analysis / Plenum press
Arami H / 2007 / Electron beam-induced “Nanocalcination” of boehmite nanostrips to mesoporous α-alumina phase / J Am Ceram Soc 90 : 3311 ~ 3313
DITABIS AG / / DITABIS imaging plate technology for all applications in transmission electron microscopy
Downing KH / 2008 / A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy / Rev Sci Instrum 79 : 043702 ~
Echlin P / 1992 / Low-temperature microscopy and analysis / Plenum press
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