지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
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In this paper, we introduce a new elliptic PDE: $$\{{\nabla}{\cdot}\(\frac{|{\gamma}^{\omega}(r)|^2}{\sigma}{\nabla}v_{\omega}(r)\)=0,\;r{\in}{\Omega},\\v_{\omega}(r)=f(r),\;r{\in}{\partial}{\Omega},$$ where ${\gamma}^{\omega}={\sigma}+i{\omega}{\epsilon}$ is the admittivity distribution of the conducting material ${\Omega}$ and it is shown that the introduced elliptic PDE can replace the standard elliptic PDE with conductivity coefficient in EIT imaging. Indeed, letting $v_0$ be the solution to the standard elliptic PDE with conductivity coefficient, the solution $v_{\omega}$ is quite close to the solution $v_0$ and can show spectroscopic properties of the conducting object ${\Omega}$ unlike $v_0$. In particular, the potential $v_{\omega}$ can be used in detecting a thin low-conducting anomaly located in ${\Omega}$ since the spectroscopic change of the Neumann data of $v_{\omega}$ is inversely proportional to thickness of the thin anomaly.
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참고문헌 (20)
참고문헌 신청
D. Holder / 2005 / Electrical Impedance Tomography: Methods, History and Applications / IOP Publishing
E. Beretta / 2003 / Asymptotic formulas for steady state voltage potentials in the presence of thin inhomogeneities. A rigorous error analysis / J. Math. Pures Appl. (9) 82 (
E. Somersalo / 1992 / Existence and uniqueness for electrode mod- els for electric current computed tomography / SIAM J. Appl. Math 52 (4) : 1023 ~ 1040
H. Ammari / 2004 / Reconstruction of thin conductivity imperfec- tions / Appl. Anal 83 (1) : 63 ~ 76
H. Ammari / 2004 / T-Scan electrical impedance imaging system for anomaly detection / SIAM J. Appl. Math 65 (1) : 252 ~ 266
E. Beretta / 2003 / Asymptotic formulas for steady state voltage potentials in the presence of thin inhomogeneities. A rigorous error analysis / J. Math. Pures Appl. (9) 82 (
E. Somersalo / 1992 / Existence and uniqueness for electrode mod- els for electric current computed tomography / SIAM J. Appl. Math 52 (4) : 1023 ~ 1040
H. Ammari / 2004 / Reconstruction of thin conductivity imperfec- tions / Appl. Anal 83 (1) : 63 ~ 76
H. Ammari / 2004 / T-Scan electrical impedance imaging system for anomaly detection / SIAM J. Appl. Math 65 (1) : 252 ~ 266
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