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Research for Pixel Wise Inspection of Machin Vision Image Using Convolutional Encoder-Decoder
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Convolutional Encoder-Decoder를 이용한 머신비전 영상의 픽셀 단위 검사에 관한 연구

논문 기본 정보

Type
Proceeding
Author
HeeYeon Jo (이화여자대학교) KyungSil Kim (이화여자대학교) EunJeong Choi (이화여자대학교) JeongTae Kim (이화여자대학교)
Journal
The Institute of Electronics and Information Engineers 대한전자공학회 학술대회 2018 IEIE FALL CONFERENCE
Published
2018.11
Pages
452 - 455 (4page)

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Research for Pixel Wise Inspection of Machin Vision Image Using Convolutional Encoder-Decoder
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Abstract· Keywords

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For inspecting defects in display devices, we study machine learning based machine vision system using images of the display devices. Specifically, we investigate two convolutional encoder-decoder based methods: one network has subsampling layers while the other has no subsampling layer. The methods have less parameters than existing convolutional encoder-decoder based methods for image classification. Experimental results show that the convolutional encoder-decoder with sub-sampling layer performs better than that of without sub-sampling layer.

Contents

Abstract
I. 서론
II. 본론
Ⅲ. 실험 내용 및 결과
Ⅳ. 결론 및 향후 연구 방향
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