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Subject

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes
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논문 기본 정보

Type
Proceeding
Author
이기범 (연세대학교) 전세준 (연세대학교) 김창욱 (연세대학교)
Journal
Korean Institute Of Industrial Engineers 대한산업공학회 추계학술대회 논문집 2016년 대한산업공학회 추계학술대회 및 정기총회
Published
2016.11
Pages
1,540 - 1,559 (20page)

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A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes
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UCI(KEPA) : I410-ECN-0101-2017-530-001572309