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Study on Emerging Technology Assessment using Patent Information
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특허 정보를 활용한 유망기술 평가 방법론

논문 기본 정보

Type
Proceeding
Author
J. S. Choi (한국지식재산전략원) J.W. Bae (한국지식재산전략원) G. J. Kim (한국지식재산전략원)
Journal
Korean Society for Precision Engineering 한국정밀공학회 학술발표대회 논문집 한국정밀공학회 2015년도 추계학술대회 논문집
Published
2015.12
Pages
43 - 44 (2page)

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Method
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Study on Emerging Technology Assessment using Patent Information
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UCI(KEPA) : I410-ECN-0101-2016-555-002277462