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자료유형
학술저널
저자정보
N. Chandra (Pondicherry University) Mashroor Ahmad Khan (Pondicherry University)
저널정보
한국신뢰성학회 International Journal of Reliability and Applications International Journal of Reliability and Applications 제15권 제2호
발행연도
2014.12
수록면
85 - 98 (14page)

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Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (ⅰ) necessity of life tests at higher steps with relevant causes (ⅱ) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

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Abstract
1. INTRODUCTION
2. PROPOSED MODEL AND ASSUMPTIONS
3. MAXIMUM LIKELIHOOD ESTIMATION AND FISHER INFORMATION MATRIX
4. COMPOUND LINEAR PLAN
5. CONFIDENCE INTERVAL AND HYPOTHESIS TESTING
6. SIMULATION STUDIES: AN EXAMPLE
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