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자료유형
학술저널
저자정보
P. W. Srivastava (University of Delhi) N. Mittal (University of Delhi)
저널정보
한국신뢰성학회 International Journal of Reliability and Applications International Journal of Reliability and Applications 제15권 제1호
발행연도
2014.6
수록면
23 - 50 (28page)

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초록· 키워드

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This paper deals with formulation of optimum multi-objective modified stepstress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

목차

Abstract
1. INTRODUCTION
2. ASSUMPTIONS AND TEST PROCEDURE
3. MODEL FORMULATION AND PARAMETER ESTIMATION
4. FORMULATION OF A MULTI-OBJECTIVE OPTIMIZATION PROBLEM
5. NUMERICAL EXAMPLE AND SENSITIVITY ANALYSIS
6. CONCLUDING REMARKS
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