지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 발행연도
- 2013.11
- 수록면
- 388 - 391 (4page)
이용수
초록· 키워드
오류제보하기
Instruction execution from the cache to detect the faulty chips in native mode has proven its effectiveness with high performance and low power consumption. Gate-level ATPG are time expensive and difficult to implement for large design. In this paper, we proposed an RTL-based methodology framework to generate the test program based on instructions set architecture (ISA) to test structural faults in processor cores. The proposed methodology framework made three major contributions. First, the use of effective conjunctive normal formula (CNF) encoding and instruction set architecture (ISA) prunes the combinational and sequential search space. Second, the modular based test generation and use of instruction set architecture (ISA) considerably reduces the test generation time. Third, an automatic generation of test instructions for structural faults.
목차
Abstract
Introduction
Related Work
Proposed Methodology
Expected Results and Discussion
Conclusion
References
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UCI(KEPA) : I410-ECN-0101-2016-569-001049359