지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2014.10
- 수록면
- 1,030 - 1,035 (6page)
이용수
초록· 키워드
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Machine vision inspection systems have replaced human inspectors in defect inspection fields for several decades. However, the inspection results of machine vision are often affected by small changes of illumination. When small changes of illumination appear in image histograms, the influence of illumination can be decreased by transformation of the histogram. In this paper, we propose an enhanced histogram matching algorithm which corrects distorted histograms by variations of illumination. We use the resolution resizing method for an optimal matching of input and reference histograms and reduction of quantization errors from the digitizing process. The proposed algorithm aims not only for improvement of the accuracy of defect detection, but also robustness against variations of illumination in machine vision inspection. The experimental results show that the proposed method maintains uniform inspection error rates under dramatic illumination changes whereas the conventional inspection method reveals inconsistent inspection results in the same illumination conditions.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. BACKGROUND
Ⅲ. THE PROPOSED INSPECTION METHOD
Ⅳ. DEFECT INSPECTION OF A REMOTE CONTROLLER
Ⅴ. EXPERIMENTS
Ⅵ. CONCLUSIONS
REFERENCES
참고문헌 (8)
참고문헌 신청
1. [학술지(정기간행물)] - G. Acciani / 2006 / Application of neural networks in optical inspection and classification of solder joints in surface mount technology / IEEE Trans. Industrial Informatics 2 (3) : 200 ~ 209
2. [학술지(정기간행물)] - Shu-Kai S. Fan / 2010 / Automatic detection of Mura defect in TFT-LCD based on regression diagnostics / Pattern Recognition Letters 31 (15) : 2397 ~ 2404
3. [단행본] - R. C. Gonzalez / 2002 / Digital image processing / Prentice Hall
4. [학술지(정기간행물)] - D. Coltuc / 2006 / Exact histogram specification / IEEE Trans. Image Process 15 (5) : 1143 ~ 1152
5. [학술지(정기간행물)] - C. -C. Sun / 2005 / Dynamic contrast enhancement based on histogram matching / IEEE Trans. Consumer Elect 51 : 1300 ~ 1305
2. [학술지(정기간행물)] - Shu-Kai S. Fan / 2010 / Automatic detection of Mura defect in TFT-LCD based on regression diagnostics / Pattern Recognition Letters 31 (15) : 2397 ~ 2404
3. [단행본] - R. C. Gonzalez / 2002 / Digital image processing / Prentice Hall
4. [학술지(정기간행물)] - D. Coltuc / 2006 / Exact histogram specification / IEEE Trans. Image Process 15 (5) : 1143 ~ 1152
5. [학술지(정기간행물)] - C. -C. Sun / 2005 / Dynamic contrast enhancement based on histogram matching / IEEE Trans. Consumer Elect 51 : 1300 ~ 1305
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UCI(KEPA) : I410-ECN-0101-2015-560-002760790