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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 IEIE Transactions on Smart Processing & Computing IEEK Transactions on Smart Processing & Computing Vol.2 No.4
- 발행연도
- 2013.8
- 수록면
- 216 - 225 (10page)
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초록· 키워드
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This paper discusses the issues regarding an abnormal V-shaped error confronting algebraic-based deconvolution process. Deconvolution was applied to an analysis of the effects of the Random Telegraph Noise (RTN) and Random Dopant Fluctuation (RDF) on the overall SRAM margin variations. This paper proposes a technique to suppress the problematic phenomena in the algebraic-based RDF/RTN deconvolution process. The proposed technique can reduce its relative errors by 10<SUP>10</SUP> to 10<SUP>16</SUP> fold, which is a sufficient reduction for avoiding the abnormal ringing errors in the RTN deconvolution process. The proposed algebraic-based analyses allowed the following: (1) detection of the truncating point of the TD-MV distributions by the screening test, and (2) predicting the MV-shift-amount by the assisted circuit schemes needed to avoid the out of specs after shipment.
목차
Abstract
1. Introduction
2. Convolution/Deconvolution of RTN and RDF
3. Discussions on the Error of the Convolution/Deconvolution Results
4. Detecting the Truncated Point
5. Summary and Discussions
References
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UCI(KEPA) : I410-ECN-0101-2015-560-001361293