메뉴 건너뛰기
.. 내서재 .. 알림
소속 기관/학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
로그인 회원가입 고객센터 ENG
주제분류

추천
검색
질문

논문 기본 정보

자료유형
학술저널
저자정보
Sung-Kwen Oh (Chungnam National University) Hong-Sik Shin (Chungnam National University) Kwang-Seok Jeong (Chungnam National University) Meng Li (Chungnam National University) Horyeong Lee (Chungnam National University) Kyumin Han (DMS) Yongwoo Lee (DMS) Ga-Won Lee (Chungnam National University) Hi-Deok Lee (Chungnam National University)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.14 No.1
발행연도
2014.2
수록면
40 - 47 (8page)

이용수

표지
📌
연구주제
📖
연구배경
🔬
연구방법
🏆
연구결과
AI에게 요청하기
추천
검색
질문

초록· 키워드

오류제보하기
In this paper, Al2O3 film deposited by thermal atomic layer deposition (ALD) with diluted NH4OH instead of H2O was suggested for passivation layer and anti-reflection (AR) coating of the p-type crystalline Si (c-Si) solar cell application. It was confirmed that the deposition rate and refractive index of Al2O3 film was proportional to the NH4OH concentration. Al2O3 film deposited with 5 % NH4OH has the greatest negative fixed oxide charge density (Qf), which can be explained by aluminum vacancies (VAl) or oxygen interstitials (Oi) under O-rich condition. Al2O3 film deposited with NH4OH 5 % condition also shows lower interface trap density (Dit) distribution than those of other conditions. At NH4OH 5 % condition, moreover, Al2O3 film shows the highest excess carrier lifetime (τPCD) and the lowest surface recombination velocity (Seff), which are linked with its passivation properties. The proposed Al2O3 film deposited with diluted NH4OH is very promising for passivation layer and AR coating of the p-type c-Si solar cell.

목차

Abstract
Ⅰ. INTRODUCTION
Ⅱ. EXPERIMENTAL
Ⅲ. RESULTS AND DISCUSSIONS
Ⅴ. CONCLUSIONS
REFERENCES

참고문헌 (17)

참고문헌 신청

이 논문의 저자 정보

최근 본 자료

전체보기

댓글(0)

0

UCI(KEPA) : I410-ECN-0101-2015-560-001276353