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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2013.12
- 수록면
- 1,094 - 1,098 (5page)
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초록· 키워드
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AVI (Automatic Vision Inspection) systems automatically detect defect features and measure their sizes via camera vision. Defect detection is not an easy process because of noises from various sources and optical distortion. In this paper the acquired images from a TFT panel are enhanced with the adoption of an HVS (Human Visual System). A human visual system is more sensitive on the defect area than the illumination components because it has greater sensitivity to variations of intensity. In this paper we modified an MTF (Modulation Transfer Function) in the Wavelet domain and utilized the characteristics of an HVS. The proposed algorithm flattens the inner illumination components while preserving the defect information intact.
목차
Abstract
Ⅰ. 서론
Ⅱ. MODIFIED MODULATION TRANSFER FUNCTION
Ⅲ. HVS (Human Visual System - 인간 지각 시스템)의 특성
Ⅳ. MMFT와 HVS를 이용한 결함성분 추출 방법
Ⅴ. 실험 및 분석
Ⅵ. 결론
REFERENCES
참고문헌 (9)
참고문헌 신청
1. [학술지(정기간행물)] - E. N. Malamas / 2003 / A survey on industrial vision systems, applications and tools / Image and Vision Computing 21 (2) : 171 ~ 188
2. [학술대회논문] - R. Sablatnig / 1997 / A flexible concept for automatic visual inspection / Czech Pattern Recognition Workshop'97, Proc. of (CPRW'97)
3. [학술지(정기간행물)] - J. H. N. Mattick / 1996 / Improved critical area prediction by application of pattern recognition techniques / Microelectronics Robustness 36 (11-12) : 1815 ~ 1818
4. [학술지(정기간행물)] - H. F. Ng / 2006 / Automatic thresholding for defect detection / Pattern Recognition Letters 27 (14) : 1644 ~ 1649
5. [학술대회논문] - G. A. Allan / 1994 / Efficient critical area estimation for arbitrary defect shapes / Workshop on Defect and Fault- Tolerance in VLSI Systems (DFT '97) 7 (3) : 284 ~ 292
2. [학술대회논문] - R. Sablatnig / 1997 / A flexible concept for automatic visual inspection / Czech Pattern Recognition Workshop'97, Proc. of (CPRW'97)
3. [학술지(정기간행물)] - J. H. N. Mattick / 1996 / Improved critical area prediction by application of pattern recognition techniques / Microelectronics Robustness 36 (11-12) : 1815 ~ 1818
4. [학술지(정기간행물)] - H. F. Ng / 2006 / Automatic thresholding for defect detection / Pattern Recognition Letters 27 (14) : 1644 ~ 1649
5. [학술대회논문] - G. A. Allan / 1994 / Efficient critical area estimation for arbitrary defect shapes / Workshop on Defect and Fault- Tolerance in VLSI Systems (DFT '97) 7 (3) : 284 ~ 292
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UCI(KEPA) : I410-ECN-0101-2014-560-003430806