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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2013.11
- 수록면
- 974 - 978 (5page)
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초록· 키워드
오류제보하기
AVI (Automatic Vision Inspection) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because different images are provided. This is caused by possible variations from the image acquisition process including optical factors, nonuniform illumination, random noises, and so on. For this reason, conventional area based defect measuring methods have problems of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome this problem, utilizing volume information that is completely ignored in the area based defect measuring method. The results show that our proposed method dramatically improves the robustness and consistency of defect size measurement.
목차
Abstract
Ⅰ. 서론
Ⅱ. 결함 추출 및 크기의 측정
Ⅲ. 체적 방식의 결함 모델링
Ⅳ. 실험 및 분석
Ⅴ. 결론
REFERENCES
참고문헌 (12)
참고문헌 신청
1. [학술지(정기간행물)] - E. N. Malamas / 2003 / A survey on industrial vision systems, applications and tools / Image and Vision Computing 21 (2) : 171 ~ 188
2. [학술대회논문] - R. Sablatnig / 1997 / A flexible concept for automatic visual inspection / Proc. of Czech Pattern Recognition Workshop'97 (CPRW'97)
3. [학술지(정기간행물)] - J. H. N. Mattick / 1996 / Improved critical area prediction by application of pattern recognition techniques / Microelectronics Robustness 36 (11-12) : 1815 ~ 1818
4. [학술지(정기간행물)] - H. F. Ng / 2006 / Automatic thresholding for defect detection / Pattern Recognition Letters 27 (14) : 1644 ~ 1649
5. [학술대회논문] - G. A. Allan / 1994 / Efficient critical area estimation for arbitrary defect shapes / Workshop on Defect and Fault- Tolerance in VLSI Systems (DFT '97) 7 (3) : 284 ~ 292
2. [학술대회논문] - R. Sablatnig / 1997 / A flexible concept for automatic visual inspection / Proc. of Czech Pattern Recognition Workshop'97 (CPRW'97)
3. [학술지(정기간행물)] - J. H. N. Mattick / 1996 / Improved critical area prediction by application of pattern recognition techniques / Microelectronics Robustness 36 (11-12) : 1815 ~ 1818
4. [학술지(정기간행물)] - H. F. Ng / 2006 / Automatic thresholding for defect detection / Pattern Recognition Letters 27 (14) : 1644 ~ 1649
5. [학술대회논문] - G. A. Allan / 1994 / Efficient critical area estimation for arbitrary defect shapes / Workshop on Defect and Fault- Tolerance in VLSI Systems (DFT '97) 7 (3) : 284 ~ 292
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UCI(KEPA) : I410-ECN-0101-2014-560-002737506